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Giuseppe Resta

Researcher
  • Phone: 0461314436
  • FBK Povo
Publications
  1. V. Mulloni;G. Resta; F. Giacomozzi;B. Margesin,
    Influence of fabrication tolerances on the reliability of RF-MEMS capacitive switches2015 XVIII AISEM Annual Conference,
    2015 XVIII AISEM Annual Conference,
    2015
    , pp. 1-
    4
    , (AISEM 2015,
    Trento,
    3-5 February 2015)
  2. F. Giacomozzi;V. Mulloni;G. Resta;B. Margesin,
    MEMS packaging by using dry film resist2015 XVIII AISEM Annual Conference,
    2015 XVIII AISEM Annual Conference,
    2015
    , pp. 1-
    4
    , (AISEM 2015,
    Trento,
    3-5 February 2015)
  3. Mulloni V.; Solazzi F.; Resta G.; Giacomozzi F.; Margesin B.,
    in «ANALOG INTEGRATED CIRCUITS AND SIGNAL PROCESSING»,
    vol. 78,
    n. 2,
    2014
    , pp. 323 -
    332
  4. V Mulloni;G Resta;B Margesin,
    Clear evidence of mechanical deformation in RF-MEMS switches during prolonged actuation,
    in «JOURNAL OF MICROMECHANICS AND MICROENGINEERING»,
    vol. 24,
    2014
    , pp. 075003 -
  5. Mulloni V.; Giacomozzi F.; Resta G.; Margesin B.,
    Long-term reliability of RF-MEMS dielectric-less capacitive switches,
    Micro Electro Mechanical Systems for Microwave amd Millimeter Wave Circuits,
    Bucharest,
    Editura Academiei Romane,
    2014
    , pp. 81 -
    88
  6. Giacomozzi F.; Mattedi F; Farinelli P.; Margesin B.; Resta G.; Mulloni V.,
    Assessment of ORDYL SY 355 dry film for
    RF MEMS 0-level packaging
    ,
    Proceedings of MEMSWAVE 2014,
    2014
    , (15th International Symposium on RF-MEMS and RF-Microsystems MEMSWAVE 2014,
    La Rochelle, France,
    30 June - 2 July 2014)
  7. J. Iannacci; G. Resta; P. Farinelli; R. Sorrentino,
    Proceedings of CIMTEC 2012,
    vol.81,
    2013
    , pp. 65-
    74
    , (CIMTEC 2012,
    Montecatini, Italy,
    10-14/07/2012)
  8. Mulloni V.; Solazzi F.; Resta G.; Giacomozzi F.; Margesin B.,
    DTIP 2013,
    EDA Publishing Association,
    2013
    , pp. 193-
    198
    , (Symposium on Design, Test, Integration & Packaging of MEMS/MOEMS,
    Barcelona, Spain,
    16-18 April 2013)
  9. G. Sordo; A. Faes; G. Resta; J. Iannacci,
    in «PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING»
    SPIE 8763,
    SPIE,
    vol.8763,
    2013
    , pp. 87630C-1-
    87630C-9
    , (SPIE Smart Sensors, Actuators, and MEMS VI,
    Grenoble, France,
    24-26/04/2013)
  10. Mulloni V.; Giacomozzi F.; Resta G.; Margesin B.,
    Long-term reliability of RF-MEMS dielectric-less capacitive switches,
    Proceedings of MEMSWAVE 2013,
    2013
    , (14th International Symposium on RF-MEMS and RF-Microsystems MEMSWAVE 2013,
    Potsdam, Germany,
    from 01/07/2013 to 03/07/2013)

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