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Viviana Mulloni

Researcher
  • Phone: 0461314496
  • FBK Povo
Short bio

Viviana Mulloni graduated in Chemistry from the University of Padova in 1993. In the same year started her PhD at the Physical Chemistry Department of the same University, working on optical properties of organic charge transfer dimers. In 1997 was at Northwestern University (IL, USA) as a postdoc researcher doing research on photorefractive materials and ultrafast dynamics of charge transfer dimers. At the beginning of 1998 joined the Physics Department of the University of Trento, working on fabrication and optical characterization of porous silicon and nanocrystalline silicon devices. In 2003 started working on MEMS devices at ITC-irst, now FBK, getting involved mainly in RF-MEMS fabrication and characterization, but also on several other devices such as flow sensors, terahertz detectors and antennas and more recently microfluidic devices. Her current research interests include the realization of MEMS and bio-MEMS devices and several selected topics in material science.

Research interests
Microtechnology MEMS Sensors and Actuators RF-MEMS Lab on Chip
Publications
  1. Giacomozzi F.; Mattedi F; Farinelli P.; Margesin B.; Resta G.; Mulloni V.,
    Assessment of ORDYL SY 355 dry film for
    RF MEMS 0-level packaging
    ,
    Proceedings of MEMSWAVE 2014,
    2014
    , (15th International Symposium on RF-MEMS and RF-Microsystems MEMSWAVE 2014,
    La Rochelle, France,
    30 June - 2 July 2014)
  2. Barbato M.; Cester A.; Mulloni V.; Margesin B.; De Pasquale G.; Soma A.; Meneghesso G.,
    Reliability of capacitive RF MEMS switches subjected to repetitive impact cycles at different temperatures,
    Proceedings of ESSDERC 2014,
    2014
    , (ESSDERC 2014 - 44th European Solid-State Conference,
    Venice, Italy,
    September 22-26, 2014)
  3. V. Mulloni; S. Colpo; A. Faes; B. Margesin,
    A simple analytical method for residual stress measurement on
    suspended MEM structures using surface profilometry
    ,
    in «JOURNAL OF MICROMECHANICS AND MICROENGINEERING»,
    vol. 23,
    n. 2,
    2013
    , pp. 025025 -
  4. V. Mulloni; F. Solazzi; F. Ficorella; A. Collini; B. Margesin,
    Influence of temperature on the actuation voltage of RF-MEMS switches,
    in «MICROELECTRONICS RELIABILITY»,
    vol. 53,
    n. 4,
    2013
    , pp. 706 -
    711
  5. Mulloni V.; Faes A.; Margesin B.,
    Wet release technology for bulk-silicon resonators
    fabrication on silicon-on-insulator substrate
    ,
    in «JOURNAL OF MICRO/NANOLITHOGRAPHY, MEMS, AND MOEMS»,
    vol. 12,
    n. 4,
    2013
    , pp. 041206 -
  6. Mulloni V.; Solazzi F.; Resta G.; Giacomozzi F.; Margesin B.,
    DTIP 2013,
    EDA Publishing Association,
    2013
    , pp. 193-
    198
    , (Symposium on Design, Test, Integration & Packaging of MEMS/MOEMS,
    Barcelona, Spain,
    16-18 April 2013)
  7. Giacomozzi F.; Mulloni V.; Colpo S.; Faes A.; Sordo G. ; Girardi S.,
    Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS, Barcelona, Spain, 16-18 April 2013.,
    EDA Publishing Association,
    2013
    , (Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS.,
    Barcelona, Spain.,
    16-18 April 2013.)
  8. Lucibello A.; Marcelli R.; Proietti E.; Bartolucci G.; Mulloni V.; Margesin B.,
    Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP), 2013 Symposium on,
    2013
    , pp. 1-
    6
    , (Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP), 2013,
    Barcelona, Spain,
    16-18 April 2013.)
  9. Mulloni V.; Giacomozzi F.; Resta G.; Margesin B.,
    Long-term reliability of RF-MEMS dielectric-less capacitive switches,
    Proceedings of MEMSWAVE 2013,
    2013
    , (14th International Symposium on RF-MEMS and RF-Microsystems MEMSWAVE 2013,
    Potsdam, Germany,
    from 01/07/2013 to 03/07/2013)
  10. V. Mulloni; J. Iannacci; R. Bartali; V. Micheli; S. Colpo; N. Laidani; B. Margesin,
    Gold-based thin multilayers for ohmic contacts in RF-MEMS switches,
    in «MICROSYSTEM TECHNOLOGIES»,
    vol. 18,
    n. 7-8,
    2012
    , pp. 965 -
    971

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