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The field of expertise of Jacopo Iannacci is in Microsystem Technologies (MEMS) for diverse applications. He received the MSc Degree in Electronic Engineering (2003) and the PhD in Information Technology (2007) from the ARCES Research Center at the University of Bologna, Italy, and worked as Visiting Researcher (2005-2006) at the DIMES Technology Center of the Technical University of Delft, the Netherlands, on the development of packaging and integration solutions for RF-MEMS devices.
He authored and co-authored numerous scientific contributions for international journals and conference proceedings, as well as books and several book chapters in the field of MEMS and RF-MEMS technology.
In 2007 he joined the Research Staff of the Center for Materials and Microsystems (CMM) at Fondazione Bruno Kessler (FBK) in Trento, Italy. Since then he focuses on (compact) modeling, design, optimization, integration, packaging and testing for reliability of MEMS/RF-MEMS devices and networks for Sensors/Actuators, Energy Harvesting and Telecommunication systems and applications.
Gaddi, R.; Iannacci, J.; Gnudi, A.,Mixed-Domain Simulation of Intermodulation Distortion in RF-MEMS Capacitive Shunt Switches,Proceedings of 33rd European Microwave Conference 2003,EuMA,2003, pp. 671-674, (33rd European Microwave Conference 2003,Munich, Germany,October)
Gaddi, R.; Iannacci, J.,Hierarchical Multidomain MEMS Simulation within an IC-Design Framework,Proceedings of the 8th Italian Conference Sensors and Microsystems (AISEM 2003),Singapore,World Scientific,2003, pp. 461-466, (8th Italian Conference Sensors and Microsystems (AISEM 2003),Trento, Italy,February)