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Flavio Giacomozzi

Researcher
  • Phone: 0461314432
  • FBK Povo
Research interests
MEMS MEMS technology RF MEMS
Publications
  1. Maurizio Dapor; Guido Cicolini; Flavio Giacomozzi; Maurizio Boscardin; G. Queirolo,
    Seeman-Bohlin x-ray diffraction study of Al-1%Si thin films used in ULSI devices,
    in «MATERIALS LETTERS»,
    vol. 13,
    1992
    , pp. 142 -
    146
  2. Fabio Marchetti; Maurizio Dapor; Stefano Girardi; Flavio Giacomozzi; Antonella Cavalleri,
    Physical properties of TiN thin films,
    in «MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING»,
    vol. A115,
    1989
    , pp. 217 -
    221
  3. Antonella Cavalleri; Maurizio Dapor; Flavio Giacomozzi; Luis Guzman; P. Ossi; M. Scotoni,
    Superconductivity in crystalline and amorphous Nb-Zr thin films,
    in «MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING»,
    vol. 99,
    1988
    , pp. 201 -
    205
  4. Antonella Cavalleri; Maurizio Dapor; Flavio Giacomozzi; Luis Guzman; P. Ossi,
    Preparation of metal glasses by ion implantation and/or sputtering,
    in «ZEITSCHRIFT FÜR PHYSIKALISCHE CHEMIE»,
    vol. 157,
    1988
    , pp. 239 -
    244
  5. L. Guzman; F. Giacomozzi; B. Margesin; L. Calliari; L. Fedrizzi; P. M. Ossi; M. Scotoni,
    Thick and homogeneous surface layers obtained by reactive ion-beam-enhanced deposition,
    in «MATERIALS SCIENCE AND ENGINEERING»,
    vol. 90,
    1987
    , pp. 349 -
    355
  6. L. Calliari; F. Giacomozzi; L. Guzman; B. Margesin; P. M. Ossi,
    Ion beam enhanced deposition and dynamic ion mixing for surface modification,
    Dordrecht/Boston/Lancaster,
    Martinus Nijhoff Publishers,
    vol.112,
    1986
    , (Erosion and Growth of Solids Stimulated by Atom and Ion Beams,
    Crete, Greece,
    September 16-27,1985)

Pages